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Ultrafast crystalline-to-amorphous phase transition in Ge2Sb2Te5 chalcogenide alloy thin film using single-shot imaging spectroscopy
http://hdl.handle.net/10131/8705
http://hdl.handle.net/10131/8705deaa0c27-bd2f-4871-a599-1e71382f09b2
名前 / ファイル | ライセンス | アクション |
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APL104-261903-2014.pdf (1.2 MB)
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Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2014-08-21 | |||||
タイトル | ||||||
タイトル | Ultrafast crystalline-to-amorphous phase transition in Ge2Sb2Te5 chalcogenide alloy thin film using single-shot imaging spectroscopy | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
著者 |
Takeda, Jun
× Takeda, Jun× Oba, Wataru× Minami, Yasuo× Saiki, Toshiharu× Katayama, Ikufumi |
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著者(ヨミ) | ||||||
識別子Scheme | WEKO | |||||
識別子 | 9 | |||||
識別子Scheme | e-Rad | |||||
識別子URI | https://kaken.nii.ac.jp/ja/search/?qm=60202165 | |||||
識別子 | 60202165 | |||||
姓名 | タケダ, ジュン | |||||
著者(ヨミ) | ||||||
識別子Scheme | WEKO | |||||
識別子 | 19066 | |||||
姓名 | オオバ, ワタル | |||||
著者(ヨミ) | ||||||
識別子Scheme | WEKO | |||||
識別子 | 19067 | |||||
姓名 | ミナミ, ヤスオ | |||||
著者(ヨミ) | ||||||
識別子Scheme | WEKO | |||||
識別子 | 19068 | |||||
姓名 | サイキ, トシハル | |||||
著者(ヨミ) | ||||||
識別子Scheme | WEKO | |||||
識別子 | 19618 | |||||
識別子Scheme | e-Rad | |||||
識別子URI | https://kaken.nii.ac.jp/ja/search/?qm=80432532 | |||||
識別子 | 80432532 | |||||
姓名 | カタヤマ, イクフミ | |||||
著者所属 | ||||||
Department of Physics, Graduate School of Engineering, Yokohama National University | ||||||
著者所属 | ||||||
Department of Physics, Graduate School of Engineering, Yokohama National University | ||||||
著者所属 | ||||||
Department of Physics, Graduate School of Engineering, Yokohama National University | ||||||
著者所属 | ||||||
Graduate School of Science and Technology, Keio University | ||||||
著者所属 | ||||||
Department of Physics, Graduate School of Engineering, Yokohama National University | ||||||
抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | We have observed an irreversible ultrafast crystalline-to-amorphous phase transition in Ge2Sb2Te5chalcogenide alloy thin film using broadband single-shot imaging spectroscopy. The absorbancechange that accompanied the ultrafast amorphization was measured via single-shot detection evenfor laser fluences above the critical value, where a permanent amorphized mark was formed. Theobserved rise time to reach the amorphization was found to be ~130-200 fs, which was in goodagreement with the half period of the A1 phonon frequency in the octahedral GeTe6 structure. Thisresult strongly suggests that the ultrafast amorphization can be attributed to the rearrangement ofGe atoms from an octahedral structure to a tetrahedral structure. Finally, based on the dependenceof the absorbance change on the laser fluence, the stability of the photoinduced amorphous phase isdiscussed. VC 2014 AIP Publishing LLC. | |||||
書誌情報 |
Applied physics letters 巻 104, 号 26, 発行日 2014-06-30 |
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ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 00036951 | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA00543431 | |||||
著者版フラグ | ||||||
出版タイプ | VoR | |||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 |