{"created":"2023-06-20T15:08:24.614047+00:00","id":4157,"links":{},"metadata":{"_buckets":{"deposit":"934320b5-363f-4c63-a658-1aa43a50783e"},"_deposit":{"created_by":3,"id":"4157","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"4157"},"status":"published"},"_oai":{"id":"oai:ynu.repo.nii.ac.jp:00004157","sets":["495:496"]},"author_link":["19618","19067","19063","19066","19061","19068","19062","9"],"item_2_biblio_info_8":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2014-06-30","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"26","bibliographicVolumeNumber":"104","bibliographic_titles":[{"bibliographic_title":"Applied physics letters"}]}]},"item_2_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"We have observed an irreversible ultrafast crystalline-to-amorphous phase transition in Ge2Sb2Te5chalcogenide alloy thin film using broadband single-shot imaging spectroscopy. The absorbancechange that accompanied the ultrafast amorphization was measured via single-shot detection evenfor laser fluences above the critical value, where a permanent amorphized mark was formed. Theobserved rise time to reach the amorphization was found to be ～130-200 fs, which was in goodagreement with the half period of the A1 phonon frequency in the octahedral GeTe6 structure. Thisresult strongly suggests that the ultrafast amorphization can be attributed to the rearrangement ofGe atoms from an octahedral structure to a tetrahedral structure. Finally, based on the dependenceof the absorbance change on the laser fluence, the stability of the photoinduced amorphous phase isdiscussed. VC 2014 AIP Publishing LLC.","subitem_description_type":"Abstract"}]},"item_2_full_name_2":{"attribute_name":"著者(ヨミ)","attribute_value_mlt":[{"nameIdentifiers":[{},{}],"names":[{"name":"タケダ, ジュン"}]},{"nameIdentifiers":[{}],"names":[{"name":"オオバ, ワタル"}]},{"nameIdentifiers":[{}],"names":[{"name":"ミナミ, ヤスオ"}]},{"nameIdentifiers":[{}],"names":[{"name":"サイキ, トシハル"}]},{"nameIdentifiers":[{},{}],"names":[{"name":"カタヤマ, イクフミ"}]}]},"item_2_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA00543431","subitem_source_identifier_type":"NCID"}]},"item_2_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"00036951","subitem_source_identifier_type":"ISSN"}]},"item_2_text_4":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Department of Physics, Graduate School of Engineering, Yokohama National University"},{"subitem_text_value":"Department of Physics, Graduate School of Engineering, Yokohama National University"},{"subitem_text_value":"Department of Physics, Graduate School of Engineering, Yokohama National University"},{"subitem_text_value":"Graduate School of Science and Technology, Keio University"},{"subitem_text_value":"Department of Physics, Graduate School of Engineering, Yokohama National University"}]},"item_2_version_type_18":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Takeda, Jun"}],"nameIdentifiers":[{"nameIdentifier":"9","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"60202165","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://kaken.nii.ac.jp/ja/search/?qm=60202165"}]},{"creatorNames":[{"creatorName":"Oba, Wataru"}],"nameIdentifiers":[{"nameIdentifier":"19061","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Minami, Yasuo"}],"nameIdentifiers":[{"nameIdentifier":"19062","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Saiki, Toshiharu"}],"nameIdentifiers":[{"nameIdentifier":"19063","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Katayama, Ikufumi"}],"nameIdentifiers":[{"nameIdentifier":"19618","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"80432532","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://kaken.nii.ac.jp/ja/search/?qm=80432532"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2016-09-16"}],"displaytype":"detail","filename":"APL104-261903-2014.pdf","filesize":[{"value":"1.2 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"APL104-261903-2014.pdf","url":"https://ynu.repo.nii.ac.jp/record/4157/files/APL104-261903-2014.pdf"},"version_id":"95112001-3c43-460b-a8cc-b6adc414de00"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Ultrafast crystalline-to-amorphous phase transition in Ge2Sb2Te5 chalcogenide alloy thin film using single-shot imaging spectroscopy","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Ultrafast crystalline-to-amorphous phase transition in Ge2Sb2Te5 chalcogenide alloy thin film using single-shot imaging spectroscopy"}]},"item_type_id":"2","owner":"3","path":["496"],"pubdate":{"attribute_name":"公開日","attribute_value":"2014-08-21"},"publish_date":"2014-08-21","publish_status":"0","recid":"4157","relation_version_is_last":true,"title":["Ultrafast crystalline-to-amorphous phase transition in Ge2Sb2Te5 chalcogenide alloy thin film using single-shot imaging spectroscopy"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-06-20T19:27:56.492036+00:00"}