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Investigation of ultrafast excited-state dynamics at the nanoscale with terahertz field-induced electron tunneling and photon emission
http://hdl.handle.net/10131/0002000247
http://hdl.handle.net/10131/000200024711bc4517-96f4-4d79-a64f-e0176c0cb6f3
名前 / ファイル | ライセンス | アクション |
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JAP-133-110903-2023-5.0144218.pdf (3.4 MB)
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Item type | 学術雑誌論文 / Journal Article(1) | |||||||||||||||
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公開日 | 2024-02-14 | |||||||||||||||
タイトル | ||||||||||||||||
言語 | en | |||||||||||||||
タイトル | Investigation of ultrafast excited-state dynamics at the nanoscale with terahertz field-induced electron tunneling and photon emission | |||||||||||||||
言語 | ||||||||||||||||
言語 | eng | |||||||||||||||
キーワード | ||||||||||||||||
主題 | Plasmons, Terahertz radiation, Scanning probe microscopy, Luminescence spectroscopy, Scanning tunneling microscopy, Nanotechnology applications, Nanomaterials, Ultrafast measurements, Excited states, Electron tunneling(en) | |||||||||||||||
資源タイプ | ||||||||||||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||||||||||
資源タイプ | journal article | |||||||||||||||
アクセス権 | ||||||||||||||||
アクセス権 | open access | |||||||||||||||
アクセス権URI | http://purl.org/coar/access_right/c_abf2 | |||||||||||||||
著者 |
Ikufumi, Katayama
× Ikufumi, Katayama
ORCID
0000-0001-6788-7732
× Kensuke, Kimura
ORCID
0000-0003-1270-5289
× Hiroshi, Imada
ORCID
0000-0001-8508-8563
× Yousoo, Kim
ORCID
0000-0001-7730-0704
× Jun, Takeda
ORCID
0000-0002-1197-6821
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書誌情報 |
en : Journal of Applied Physics 巻 133, 号 11, 発行日 2023-03-21 |
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ISSN | ||||||||||||||||
収録物識別子タイプ | EISSN | |||||||||||||||
収録物識別子 | 10897550 | |||||||||||||||
書誌レコードID | ||||||||||||||||
収録物識別子タイプ | NCID | |||||||||||||||
収録物識別子 | AA00693547 | |||||||||||||||
DOI | ||||||||||||||||
関連タイプ | isIdenticalTo | |||||||||||||||
識別子タイプ | DOI | |||||||||||||||
関連識別子 | https://doi.org/10.1063/5.0144218 | |||||||||||||||
著者版フラグ | ||||||||||||||||
出版タイプ | VoR | |||||||||||||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||||||||||||
出版者 | ||||||||||||||||
出版者 | AIP Publishing |