{"created":"2023-06-20T15:13:00.123890+00:00","id":9941,"links":{},"metadata":{"_buckets":{"deposit":"760a1701-d05e-47ab-b2f9-2eec73141180"},"_deposit":{"created_by":3,"id":"9941","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"9941"},"status":"published"},"_oai":{"id":"oai:ynu.repo.nii.ac.jp:00009941","sets":["1006:1009"]},"author_link":["35765","35766","35764"],"item_2_biblio_info_8":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2018-06","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"24","bibliographicPageStart":"19","bibliographicVolumeNumber":"85","bibliographic_titles":[{"bibliographic_title":"Microelectronics Reliability"}]}]},"item_2_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"In this study, the potential failure modes of a small operational amplifier circuit board were investigated. The high accelerated limit test (HALT) was employed to identify the failure modes under multi-axial vibration and temperature loadings. Five stress tests, specifically, low and high temperature, vibration, thermal shock, and composite profiles were performed. An aluminum electrolytic capacitor was damaged under the low temperature process, whereas the capacitance of a ceramic capacitor decreased under the high temperature process. The vibration test revealed that mechanical fatigue occurs at the terminal leads of aluminum electrolytic capacitors. The HALT also revealed coupled effects between high and low temperature processes and vibration.","subitem_description_type":"Abstract"}]},"item_2_publisher_35":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Elsevier"}]},"item_2_relation_13":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1016/j.microrel.2018.04.005","subitem_relation_type_select":"DOI"}}]},"item_2_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11538014","subitem_source_identifier_type":"NCID"}]},"item_2_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"00262714","subitem_source_identifier_type":"ISSN"}]},"item_2_text_4":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Institute of Advanced Sciences, Yokohama National University"},{"subitem_text_value":"Graduate School of Environment and Information Sciences, Yokohama National University"},{"subitem_text_value":"Center for Creation of Symbiosis Society with Risk, Yokohama National University"}]},"item_2_version_type_18":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Sakamoto, Junji"}],"nameIdentifiers":[{"nameIdentifier":"35765","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"50752052","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://kaken.nii.ac.jp/ja/search/?qm=50752052"}]},{"creatorNames":[{"creatorName":"Hirata, Ryoma"}],"nameIdentifiers":[{"nameIdentifier":"35766","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Shibutani, Tadahiro"}],"nameIdentifiers":[{"nameIdentifier":"35764","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"10332644","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://kaken.nii.ac.jp/ja/search/?qm=10332644"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-07-01"}],"displaytype":"detail","filename":"Revised Manuscript_HALT_for_OP_20180405.pdf","filesize":[{"value":"945.0 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"Revised Manuscript_HALT_for_OP_20180405.pdf","url":"https://ynu.repo.nii.ac.jp/record/9941/files/Revised Manuscript_HALT_for_OP_20180405.pdf"},"version_id":"f6774a8a-946c-437e-ac3d-dec6a3e1f236"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"High accelerated limit test","subitem_subject_scheme":"Other"},{"subitem_subject":"Operational amplifier circuit board","subitem_subject_scheme":"Other"},{"subitem_subject":"Potential failure mode","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Potential failure mode identification of operational amplifier circuit board by using high accelerated limit test","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Potential failure mode identification of operational amplifier circuit board by using high accelerated limit test"}]},"item_type_id":"2","owner":"3","path":["1009"],"pubdate":{"attribute_name":"公開日","attribute_value":"2019-06-06"},"publish_date":"2019-06-06","publish_status":"0","recid":"9941","relation_version_is_last":true,"title":["Potential failure mode identification of operational amplifier circuit board by using high accelerated limit test"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-06-20T17:43:04.124045+00:00"}