@article{oai:ynu.repo.nii.ac.jp:00009941,
 author = {Sakamoto, Junji and Hirata, Ryoma and Shibutani, Tadahiro},
 journal = {Microelectronics Reliability},
 month = {Jun},
 note = {In this study, the potential failure modes of a small operational amplifier circuit board were investigated. The high accelerated limit test (HALT) was employed to identify the failure modes under multi-axial vibration and temperature loadings. Five stress tests, specifically, low and high temperature, vibration, thermal shock, and composite profiles were performed. An aluminum electrolytic capacitor was damaged under the low temperature process, whereas the capacitance of a ceramic capacitor decreased under the high temperature process. The vibration test revealed that mechanical fatigue occurs at the terminal leads of aluminum electrolytic capacitors. The HALT also revealed coupled effects between high and low temperature processes and vibration.},
 pages = {19--24},
 title = {Potential failure mode identification of operational amplifier circuit board by using high accelerated limit test},
 volume = {85},
 year = {2018}
}