{"created":"2023-06-20T15:12:05.630604+00:00","id":8794,"links":{},"metadata":{"_buckets":{"deposit":"b971498b-bb3a-493c-a91e-0d4332a191aa"},"_deposit":{"created_by":3,"id":"8794","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"8794"},"status":"published"},"_oai":{"id":"oai:ynu.repo.nii.ac.jp:00008794","sets":["495:496"]},"author_link":["33507","19078","33508"],"item_2_biblio_info_8":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2016-11-15","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"103","bibliographicPageStart":"101","bibliographicVolumeNumber":"530","bibliographic_titles":[{"bibliographic_title":"Physica C: Superconductivity and its Applications"}]}]},"item_2_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The relationship between the timing margin and the error rate of the large-scale single flux quantum logic circuits is quantitatively investigated to establish a timing design guideline. We observed that the fluctuation in the set-up/hold time of single flux quantum logic gates caused by thermal noises is the most probable origin of the logical error of the large-scale single flux quantum circuit. The appropriate timing margin for stable operation of the large-scale logic circuit is discussed by taking the fluctuation of setup/hold time and the timing jitter in the single flux quantum circuits. As a case study, the dependence of the error rate of the 1-million-bit single flux quantum shift register on the timing margin is statistically analyzed. The result indicates that adjustment of timing margin and the bias voltage is important for stable operation of a large-scale SFQ logic circuit.","subitem_description_type":"Abstract"}]},"item_2_publisher_35":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Elsevier Science"}]},"item_2_relation_13":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1016/j.physc.2016.03.001","subitem_relation_type_select":"DOI"}}]},"item_2_rights_14":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"© 2016. This manuscript version is made available under the CC-BY-NC-ND 4.0 license http://creativecommons.org/licenses/by-nc-nd/4.0/ "}]},"item_2_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11461984","subitem_source_identifier_type":"NCID"}]},"item_2_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"09214534","subitem_source_identifier_type":"ISSN"}]},"item_2_text_4":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Department of Electrical and Computer Engineering, Yokohama National University"},{"subitem_text_value":"Department of Electrical and Computer Engineering, Yokohama National University"},{"subitem_text_value":"Department of Electrical and Computer Engineering, Yokohama National University"}]},"item_2_version_type_18":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Yamanashi, Yuki"}],"nameIdentifiers":[{"nameIdentifier":"19078","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"70467059","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://kaken.nii.ac.jp/ja/search/?qm=70467059"}]},{"creatorNames":[{"creatorName":"Masubuchi, Kota"}],"nameIdentifiers":[{"nameIdentifier":"33507","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Yoshikawa, Nobuyuki"}],"nameIdentifiers":[{"nameIdentifier":"33508","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-11-16"}],"displaytype":"detail","filename":"Yamanashi2016PhysicaC.pdf","filesize":[{"value":"515.1 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"Yamanashi2016PhysicaC.pdf","url":"https://ynu.repo.nii.ac.jp/record/8794/files/Yamanashi2016PhysicaC.pdf"},"version_id":"944259e3-f59d-4ca4-be45-ff0e71882892"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Statistical analysis of error rate of large-scale single flux quantum logic circuit by considering fluctuation of timing parameters","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Statistical analysis of error rate of large-scale single flux quantum logic circuit by considering fluctuation of timing parameters"}]},"item_type_id":"2","owner":"3","path":["496"],"pubdate":{"attribute_name":"公開日","attribute_value":"2018-02-01"},"publish_date":"2018-02-01","publish_status":"0","recid":"8794","relation_version_is_last":true,"title":["Statistical analysis of error rate of large-scale single flux quantum logic circuit by considering fluctuation of timing parameters"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-06-20T19:29:53.456819+00:00"}