{"created":"2023-06-20T15:08:24.344343+00:00","id":4151,"links":{},"metadata":{"_buckets":{"deposit":"13d09608-3b12-47cb-bb34-254e610e1693"},"_deposit":{"created_by":3,"id":"4151","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"4151"},"status":"published"},"_oai":{"id":"oai:ynu.repo.nii.ac.jp:00004151","sets":["495:496"]},"author_link":["19004","19618","19001","19005","19000","9"],"item_2_biblio_info_8":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2013-07-29","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"5","bibliographicVolumeNumber":"103","bibliographic_titles":[{"bibliographic_title":"Applied physics letters"}]}]},"item_2_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Single-shot measurements of terahertz (THz) electric-field waveforms are demonstrated using areflective echelon mirror, which produces multiple probe pulses with different time-delays. Thepolarization rotation of the probe pulses, due to the electro-optic effect induced by the THz electricfield generated from grating-coupled LiNbO3, was imaged onto a two-dimensional complementarymetal-oxide-semiconductor camera. A waveform with a weak peak field strength of 0.6 kV/cm wasobtained with a good signal-to-noise ratio, demonstrating precise single-shot detection of the THzelectric field waveform. VC 2013 AIP Publishing LLC.","subitem_description_type":"Abstract"}]},"item_2_full_name_2":{"attribute_name":"著者(ヨミ)","attribute_value_mlt":[{"nameIdentifiers":[{}],"names":[{"name":"ミナミ, ヤスオ"}]},{"nameIdentifiers":[{}],"names":[{"name":"ハヤシ, ユウスケ"}]},{"nameIdentifiers":[{},{}],"names":[{"name":"タケダ, ジュン"}]},{"nameIdentifiers":[{},{}],"names":[{"name":"カタヤマ, イクフミ"}]}]},"item_2_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA00543431","subitem_source_identifier_type":"NCID"}]},"item_2_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"00036951","subitem_source_identifier_type":"ISSN"}]},"item_2_text_4":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Department of Physics, Graduate School of Engineering, Yokohama National University"},{"subitem_text_value":"Department of Physics, Graduate School of Engineering, Yokohama National University"},{"subitem_text_value":"Department of Physics, Graduate School of Engineering, Yokohama National University"},{"subitem_text_value":"Department of Physics, Graduate School of Engineering, Yokohama National University"}]},"item_2_version_type_18":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Minami, Yasuo"}],"nameIdentifiers":[{"nameIdentifier":"19000","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hayashi, Yusuke"}],"nameIdentifiers":[{"nameIdentifier":"19001","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Takeda, Jun"}],"nameIdentifiers":[{"nameIdentifier":"9","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"60202165","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://kaken.nii.ac.jp/ja/search/?qm=60202165"}]},{"creatorNames":[{"creatorName":"Katayama, Ikufumi"}],"nameIdentifiers":[{"nameIdentifier":"19618","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"80432532","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://kaken.nii.ac.jp/ja/search/?qm=80432532"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2016-09-16"}],"displaytype":"detail","filename":"APL103_051103.pdf","filesize":[{"value":"3.5 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"APL103_051103.pdf","url":"https://ynu.repo.nii.ac.jp/record/4151/files/APL103_051103.pdf"},"version_id":"f54512a2-69de-4f68-962e-ccedf7e04c50"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Single-shot measurement of a terahertz electric-field waveform using a reflective echelon mirror","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Single-shot measurement of a terahertz electric-field waveform using a reflective echelon mirror"}]},"item_type_id":"2","owner":"3","path":["496"],"pubdate":{"attribute_name":"公開日","attribute_value":"2014-05-26"},"publish_date":"2014-05-26","publish_status":"0","recid":"4151","relation_version_is_last":true,"title":["Single-shot measurement of a terahertz electric-field waveform using a reflective echelon mirror"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-06-20T19:27:52.599263+00:00"}