{"created":"2023-06-20T15:13:16.529617+00:00","id":10246,"links":{},"metadata":{"_buckets":{"deposit":"0239ab52-35b4-4c55-9487-81f2ab68edab"},"_deposit":{"created_by":3,"id":"10246","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"10246"},"status":"published"},"_oai":{"id":"oai:ynu.repo.nii.ac.jp:00010246","sets":["495:496"]},"author_link":["36507","36509","36508","36511","35498","36510"],"item_2_biblio_info_8":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2018-08","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"215","bibliographicPageStart":"211","bibliographicVolumeNumber":"83","bibliographic_titles":[{"bibliographic_title":"Materials Science in Semiconductor Processing"}]}]},"item_2_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The anticorrosive property of yttrium oxide was evaluated using chlorine trifluoride gas. After the exposure to chlorine trifluoride gas at room temperature for the total time longer than 1000 min, the yttrium oxide film, formed on a quartz glass surface, did not show any etching behavior and surface morphology change, while the non-coated quartz glass showed a rough surface with the etching depth of nearly 0.1 mm. Because yttrium oxide had no chemical reaction with chlorine trifluoride gas at temperatures less than 300 °C, yttrium oxide film is expected to protect the quartz glass from etching by chlorine trifluoride gas at room temperature for a significantly long time.","subitem_description_type":"Abstract"}]},"item_2_publisher_35":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Elsevier"}]},"item_2_relation_13":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1016/j.mssp.2018.04.043","subitem_relation_type_select":"DOI"}}]},"item_2_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11350145","subitem_source_identifier_type":"NCID"}]},"item_2_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"13698001","subitem_source_identifier_type":"ISSN"}]},"item_2_text_4":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Yokohama National University, 79-5 Tokiwadai, Hodogaya, Yokohama 240-8501, Japan"},{"subitem_text_value":"Techno-Quartz, Inc., 2-1-4 Zaomatsugaoka, Yamagata 990-2338, Japan"},{"subitem_text_value":"Yokohama National University, 79-5 Tokiwadai, Hodogaya, Yokohama 240-8501, Japan"},{"subitem_text_value":"Yokohama National University, 79-5 Tokiwadai, Hodogaya, Yokohama 240-8501, Japan"},{"subitem_text_value":"Yokohama National University, 79-5 Tokiwadai, Hodogaya, Yokohama 240-8501, Japan"},{"subitem_text_value":"Yokohama National University, 79-5 Tokiwadai, Hodogaya, Yokohama 240-8501, Japan"}]},"item_2_version_type_18":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Kawasaki, Ryohei"}],"nameIdentifiers":[{"nameIdentifier":"36507","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Umetsu, Yasuhiro"}],"nameIdentifiers":[{"nameIdentifier":"36508","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kurashima, Keisuke"}],"nameIdentifiers":[{"nameIdentifier":"36509","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Shioda, Kohei"}],"nameIdentifiers":[{"nameIdentifier":"36510","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hirooka, Asumi"}],"nameIdentifiers":[{"nameIdentifier":"36511","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Habuka, Hitoshi"}],"nameIdentifiers":[{"nameIdentifier":"35498","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"40323927","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://kaken.nii.ac.jp/ja/search/?qm=40323927"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-09-01"}],"displaytype":"detail","filename":"Y2O3.pdf","filesize":[{"value":"9.5 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"Y2O3.pdf","url":"https://ynu.repo.nii.ac.jp/record/10246/files/Y2O3.pdf"},"version_id":"878e43f2-04ab-480a-a5b5-f63287ea79dd"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Yttrium oxide","subitem_subject_scheme":"Other"},{"subitem_subject":"Chlorine trifluoride gas","subitem_subject_scheme":"Other"},{"subitem_subject":"Coating film","subitem_subject_scheme":"Other"},{"subitem_subject":"Quartz glass","subitem_subject_scheme":"Other"},{"subitem_subject":"Etching","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Yttrium oxide film for protecting quartz glass surface from etching by long-term exposure to chlorine trifluoride gas at room temperature","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Yttrium oxide film for protecting quartz glass surface from etching by long-term exposure to chlorine trifluoride gas at room temperature"}]},"item_type_id":"2","owner":"3","path":["496"],"pubdate":{"attribute_name":"公開日","attribute_value":"2020-02-18"},"publish_date":"2020-02-18","publish_status":"0","recid":"10246","relation_version_is_last":true,"title":["Yttrium oxide film for protecting quartz glass surface from etching by long-term exposure to chlorine trifluoride gas at room temperature"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-06-20T18:35:17.012407+00:00"}