{"created":"2023-06-20T15:13:14.658785+00:00","id":10215,"links":{},"metadata":{"_buckets":{"deposit":"4e00816a-1de2-4fa5-ae06-bade6454fb0d"},"_deposit":{"created_by":3,"id":"10215","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"10215"},"status":"published"},"_oai":{"id":"oai:ynu.repo.nii.ac.jp:00010215","sets":["495:496"]},"author_link":["36416","36415","36414","36417"],"item_2_biblio_info_8":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2019-10-03","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"5","bibliographicPageEnd":"1384","bibliographicPageStart":"1377","bibliographicVolumeNumber":"26","bibliographic_titles":[{"bibliographic_title":"IEEE Transactions on Dielectrics and Electrical Insulation"}]}]},"item_2_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"With the miniaturization of electrical devices, the insulation width and the separation between electrodes have been accordingly reduced. Consequently, electrical breakdown across micrometer-scale gaps is of great practical interest for insulation design. In this paper, electrical breakdown across micrometer scale surface gap in atmospheric air was investigated under inhomogeneous field. The breakdown was measured under negative impulse voltage and the generation and movement of neutral and charged particles were simulated based on PIC-MCC (particle-in-cell with Monte Carlo collision). The result shows that the breakdown phenomena across micrometer scale gaps is mainly determined by field emission current from the cathode surface, similar to the discharge process in vacuum. The positive ions generated by collision of electrons to neutral particles enhance the electric field near the cathode, resulting in the increase of the field emission current from the cathode.","subitem_description_type":"Abstract"}]},"item_2_description_6":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"© 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.","subitem_description_type":"Other"}]},"item_2_publisher_35":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_2_relation_13":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1109/TDEI.2019.007921","subitem_relation_type_select":"DOI"}}]},"item_2_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA10992839","subitem_source_identifier_type":"NCID"}]},"item_2_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"10709878","subitem_source_identifier_type":"ISSN"}]},"item_2_text_4":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Yokohama National University, Faculty of Engineering, 79-5 Tokiwadai, Hodogaya-ku, Yokohama, 240-8501 Japan"},{"subitem_text_value":"Yokohama National University, Faculty of Engineering, 79-5 Tokiwadai, Hodogaya-ku, Yokohama, 240-8501 Japan"},{"subitem_text_value":"The University of Tokyo, Department of Engineering and Information Systems, 7-3-1 Hongo, Bunkyo-ku, Tokyo, 113-8656 Japan"},{"subitem_text_value":"The University of Tokyo, Department of Engineering and Information Systems, 7-3-1 Hongo, Bunkyo-ku, Tokyo, 113-8656 Japan"}]},"item_2_version_type_18":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Iwabuchi, Hiroyuki"}],"nameIdentifiers":[{"nameIdentifier":"36414","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"50757341","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://kaken.nii.ac.jp/ja/search/?qm=50757341"}]},{"creatorNames":[{"creatorName":"Oyama, Tsutomu"}],"nameIdentifiers":[{"nameIdentifier":"36415","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"40160642","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://kaken.nii.ac.jp/ja/search/?qm=40160642"}]},{"creatorNames":[{"creatorName":"Kumada, Akiko"}],"nameIdentifiers":[{"nameIdentifier":"36416","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"20313009","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://kaken.nii.ac.jp/ja/search/?qm=20313009"}]},{"creatorNames":[{"creatorName":"Hidaka, Kunihiko"}],"nameIdentifiers":[{"nameIdentifier":"36417","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-01-31"}],"displaytype":"detail","filename":"7921 proofed_Iwabuchi.pdf","filesize":[{"value":"1.0 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"7921 proofed_Iwabuchi.pdf","url":"https://ynu.repo.nii.ac.jp/record/10215/files/7921 proofed_Iwabuchi.pdf"},"version_id":"a25d0a17-cf9e-4abe-8310-c0b31984d988"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Breakdown voltage","subitem_subject_scheme":"Other"},{"subitem_subject":"Electric fields","subitem_subject_scheme":"Other"},{"subitem_subject":"Micrometers","subitem_subject_scheme":"Other"},{"subitem_subject":"Cathodes","subitem_subject_scheme":"Other"},{"subitem_subject":"Discharges (electric)","subitem_subject_scheme":"Other"},{"subitem_subject":"electrical devices","subitem_subject_scheme":"Other"},{"subitem_subject":"micrometer-scale gap","subitem_subject_scheme":"Other"},{"subitem_subject":"vacuum breakdown","subitem_subject_scheme":"Other"},{"subitem_subject":"electric field emission","subitem_subject_scheme":"Other"},{"subitem_subject":"PIC-MCC method","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Breakdown phenomena across micrometer scale surface gap under negative voltage application","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Breakdown phenomena across micrometer scale surface gap under negative voltage application"}]},"item_type_id":"2","owner":"3","path":["496"],"pubdate":{"attribute_name":"公開日","attribute_value":"2020-01-31"},"publish_date":"2020-01-31","publish_status":"0","recid":"10215","relation_version_is_last":true,"title":["Breakdown phenomena across micrometer scale surface gap under negative voltage application"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-06-20T18:35:43.064526+00:00"}