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Grazing incidence x-ray diffraction measurements of columnar InAs/GaAsq quantum dot structures
http://hdl.handle.net/10131/8140
http://hdl.handle.net/10131/8140843c8946-a047-4273-ad50-a796c2f6a255
名前 / ファイル | ライセンス | アクション |
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10pMukai_JJAPr.pdf (461.2 kB)
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Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2012-09-14 | |||||
タイトル | ||||||
タイトル | Grazing incidence x-ray diffraction measurements of columnar InAs/GaAsq quantum dot structures | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
著者 |
Mukai, Kohki
× Mukai, Kohki× Watanabe, Keita× Kimura, Yuuta |
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著者(ヨミ) | ||||||
識別子Scheme | WEKO | |||||
識別子 | 19879 | |||||
姓名 | ムカイ, コウキ | |||||
著者(ヨミ) | ||||||
識別子Scheme | WEKO | |||||
識別子 | 19880 | |||||
姓名 | ワタナベ, ケイタ | |||||
著者(ヨミ) | ||||||
識別子Scheme | WEKO | |||||
識別子 | 19881 | |||||
姓名 | キムラ, ユウタ | |||||
著者所属 | ||||||
Department of Solid State Materials and Engineering, Graduate School of Engineering,Yokohama National University | ||||||
著者所属 | ||||||
Department of Solid State Materials and Engineering, Graduate School of Engineering,Yokohama National University | ||||||
著者所属 | ||||||
Department of Solid State Materials and Engineering, Graduate School of Engineering,Yokohama National University | ||||||
抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | The lattice constant distribution inside a columnar InAs/GaAs quantum dot (QD) and its crystal orientation dependence were evaluated by grazing incidence X-ray diffraction (GIXD) measurement. The QDs were grown by stacking Stranski-krastanow (SK)-type InAs QDs directly in the growth direction with very thin GaAs interval layers. We evaluated the dependence of the in-plane lattice constant on QD height by GIXD measurement using equipment available for laboratories. We found that the lattice constants at the top and bottom of the QDs were almost the same when the height and diameter of the QDs were almost equal. As the number of stacks was increased to grow high QDs, the lattice constant at the QD top became larger in the [1-10] direction than in the [110] direction, but this relationship was reversed at the bottom. We consider that GIXD measurement with compact equipment will contribute to the swift and efficient development of QD devices. | |||||
書誌情報 |
Japanese journal of applied physics 巻 49, p. 04DH07, 発行日 2010 |
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ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 00214922 | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA12295836 | |||||
フォーマット | ||||||
内容記述タイプ | Other | |||||
内容記述 | application/pdf | |||||
著者版フラグ | ||||||
出版タイプ | AM | |||||
出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||
出版者 | ||||||
出版者 | The Japan Society of Applied Physics |