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{"_buckets": {"deposit": "760a1701-d05e-47ab-b2f9-2eec73141180"}, "_deposit": {"created_by": 3, "id": "9941", "owners": [3], "pid": {"revision_id": 0, "type": "depid", "value": "9941"}, "status": "published"}, "_oai": {"id": "oai:ynu.repo.nii.ac.jp:00009941", "sets": ["1009"]}, "author_link": ["35765", "35766", "35764"], "item_2_biblio_info_8": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2018-06", "bibliographicIssueDateType": "Issued"}, "bibliographicPageEnd": "24", "bibliographicPageStart": "19", "bibliographicVolumeNumber": "85", "bibliographic_titles": [{"bibliographic_title": "Microelectronics Reliability"}]}]}, "item_2_description_5": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "In this study, the potential failure modes of a small operational amplifier circuit board were investigated. The high accelerated limit test (HALT) was employed to identify the failure modes under multi-axial vibration and temperature loadings. Five stress tests, specifically, low and high temperature, vibration, thermal shock, and composite profiles were performed. An aluminum electrolytic capacitor was damaged under the low temperature process, whereas the capacitance of a ceramic capacitor decreased under the high temperature process. The vibration test revealed that mechanical fatigue occurs at the terminal leads of aluminum electrolytic capacitors. The HALT also revealed coupled effects between high and low temperature processes and vibration.", "subitem_description_type": "Abstract"}]}, "item_2_publisher_35": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "Elsevier"}]}, "item_2_relation_13": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type": "isVersionOf", "subitem_relation_type_id": {"subitem_relation_type_id_text": "https://doi.org/10.1016/j.microrel.2018.04.005", "subitem_relation_type_select": "DOI"}}]}, "item_2_source_id_11": {"attribute_name": "書誌レコードID", "attribute_value_mlt": [{"subitem_source_identifier": "AA11538014", "subitem_source_identifier_type": "NCID"}]}, "item_2_source_id_9": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "00262714", "subitem_source_identifier_type": "ISSN"}]}, "item_2_text_4": {"attribute_name": "著者所属", "attribute_value_mlt": [{"subitem_text_value": "Institute of Advanced Sciences, Yokohama National University"}, {"subitem_text_value": "Graduate School of Environment and Information Sciences, Yokohama National University"}, {"subitem_text_value": "Center for Creation of Symbiosis Society with Risk, Yokohama National University"}]}, "item_2_version_type_18": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_version_resource": "http://purl.org/coar/version/c_ab4af688f83e57aa", "subitem_version_type": "AM"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Sakamoto, Junji"}], "nameIdentifiers": [{"nameIdentifier": "35765", "nameIdentifierScheme": "WEKO"}, {"nameIdentifier": "50752052", "nameIdentifierScheme": "e-Rad", "nameIdentifierURI": "https://kaken.nii.ac.jp/ja/search/?qm=50752052"}]}, {"creatorNames": [{"creatorName": "Hirata, Ryoma"}], "nameIdentifiers": [{"nameIdentifier": "35766", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Shibutani, Tadahiro"}], "nameIdentifiers": [{"nameIdentifier": "35764", "nameIdentifierScheme": "WEKO"}, {"nameIdentifier": "10332644", "nameIdentifierScheme": "e-Rad", "nameIdentifierURI": "https://kaken.nii.ac.jp/ja/search/?qm=10332644"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2020-07-01"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "Revised Manuscript_HALT_for_OP_20180405.pdf", "filesize": [{"value": "945.0 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 945000.0, "url": {"label": "Revised Manuscript_HALT_for_OP_20180405.pdf", "url": "https://ynu.repo.nii.ac.jp/record/9941/files/Revised Manuscript_HALT_for_OP_20180405.pdf"}, "version_id": "f6774a8a-946c-437e-ac3d-dec6a3e1f236"}]}, "item_keyword": {"attribute_name": "キーワード", "attribute_value_mlt": [{"subitem_subject": "High accelerated limit test", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Operational amplifier circuit board", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Potential failure mode", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Potential failure mode identification of operational amplifier circuit board by using high accelerated limit test", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Potential failure mode identification of operational amplifier circuit board by using high accelerated limit test"}]}, "item_type_id": "2", "owner": "3", "path": ["1009"], "permalink_uri": "http://hdl.handle.net/10131/00012607", "pubdate": {"attribute_name": "公開日", "attribute_value": "2019-06-06"}, "publish_date": "2019-06-06", "publish_status": "0", "recid": "9941", "relation": {}, "relation_version_is_last": true, "title": ["Potential failure mode identification of operational amplifier circuit board by using high accelerated limit test"], "weko_shared_id": 3}
Potential failure mode identification of operational amplifier circuit board by using high accelerated limit test
http://hdl.handle.net/10131/00012607
http://hdl.handle.net/10131/00012607c6c09654-edfe-48f8-97be-65e9b705458e
名前 / ファイル | ライセンス | アクション |
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Revised Manuscript_HALT_for_OP_20180405.pdf (945.0 kB)
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Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2019-06-06 | |||||
タイトル | ||||||
タイトル | Potential failure mode identification of operational amplifier circuit board by using high accelerated limit test | |||||
言語 | ||||||
言語 | eng | |||||
キーワード | ||||||
主題 | High accelerated limit test, Operational amplifier circuit board, Potential failure mode | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
著者 |
Sakamoto, Junji
× Sakamoto, Junji× Hirata, Ryoma× Shibutani, Tadahiro |
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著者所属 | ||||||
Institute of Advanced Sciences, Yokohama National University | ||||||
著者所属 | ||||||
Graduate School of Environment and Information Sciences, Yokohama National University | ||||||
著者所属 | ||||||
Center for Creation of Symbiosis Society with Risk, Yokohama National University | ||||||
抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | In this study, the potential failure modes of a small operational amplifier circuit board were investigated. The high accelerated limit test (HALT) was employed to identify the failure modes under multi-axial vibration and temperature loadings. Five stress tests, specifically, low and high temperature, vibration, thermal shock, and composite profiles were performed. An aluminum electrolytic capacitor was damaged under the low temperature process, whereas the capacitance of a ceramic capacitor decreased under the high temperature process. The vibration test revealed that mechanical fatigue occurs at the terminal leads of aluminum electrolytic capacitors. The HALT also revealed coupled effects between high and low temperature processes and vibration. | |||||
書誌情報 |
Microelectronics Reliability 巻 85, p. 19-24, 発行日 2018-06 |
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ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 00262714 | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA11538014 | |||||
DOI | ||||||
関連タイプ | isVersionOf | |||||
識別子タイプ | DOI | |||||
関連識別子 | https://doi.org/10.1016/j.microrel.2018.04.005 | |||||
著者版フラグ | ||||||
出版タイプ | AM | |||||
出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||
出版者 | ||||||
出版者 | Elsevier |